IEC 60749-30:2011 pdf – Semiconductor devices- Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

IEC 60749-30:2011 pdf – Semiconductor devices- Mechanical and climatic test methods – Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing. 5.2 Moisture chamber Moisture chamber(s) capable of operating at 85 00/85 % RH (relative humidity), 85...