ISO IEC 10373-3:2010 pdf – ldentification cards-Test methods—Part 3: lntegrated circuit cards with contacts and related interface devices.
e) Power down the card
1) Set the card-test-apparatus to the parameters shown in Table 46.
g) Reset the card.
Ii) Run the Test Scenario. During this communication the charactenstics and values shown in Table 47 shall be continuously monitored and the values determined.
I) Power down the card.
j) Repeat step b) to i) for all supported voltage classes.
5.4.3 Test report
The test repOrt shall state the capacitance of the RST-contact, the values determined in the procedure and
whether all communications were in conformance with ISO/lEG 7816-3.
5.5 SPU (C6) contact
There is no standard test that applies to the SPU (C6) contact If this contact field is used in a proprietary application, then application specific tests should be applied.
6 Test methods for logical operations of cards with contacts
6.1 Answer to reset
6.1.1 Cold Reset and Answer-to-Reset (ATR)
The purpose of this test is to determine the behavior of the card during the cold reset procedure according to
ISO/IEC 7816-3:2006. 6.22.
6.1.1.1 Apparatus
See 4.7.1
6.1.1.2 Procedure
Connect the card to the card-test-apparatus.
During the following procedure the contacts VCC, RST, CLK and I/O shall be continuously monitored and all signal transitions (level and timing) as well as the logical content of the communication shall be recorded.
a) Activate the card in accordance wiih ISO/IEC 7816-3:2006, 6.2.1.
b) Set RST to state H 400 clock-cycles after CIK was activated.
c) If the card reacts with sending an ATR, signal a transmission error in accordance with ISOIIEC 7816-3:2006, 7.3 for at least one character (randomly chosen) of the ATR.
d) Run the Test Scenario with the card.
e) Deactivate the card.
6.1.1.3 Test report
Report the sbgnal recordings and the ATR.
6.1.2 Warm Reset
The purpose & this test is to determine the behavior of the card durmg the warm reset procedure according to
ISO1IEC 7816-3:2006. 6.2.3.
6.1.2.1 Apparatus
See 4.7.1
6.1.2.2 Proc.dure
Connect the card to the card-test-apparatus.
During the following procedure the contacts VCC, RST, CLK and I/O shall be continuously monitored and all signal transitions (leve’ and timing) as well as the logical content of the communication shall be recorded:
a) Activate and reset the card in accordance with ISO/IEC 7816-3:2006, 6.2.1 and 6.2.2.
b) Run the Test Scenario with the card.
C) Generate a warm reset with a duration of 400 clock-cycles in accordance with ISOIIEC 7816-3:2006.
6.2.3.
d) If the card reacts with sending an ATR, signal a transmission error in accordance with ISOIIEC 7816-3:2006, 7.3 for at least one character (randomly chosen) of the ATR.
e) Run the Test Scenario with the card.
0 Power down the card.
6.1.2.3 Test report
Report the signal recordings and the ATR,
6.2 T0 Protocol
The subsequent tests are applicable only if the card supports the ThO protocol.
Note — r4 is defined in Table 14 — I/O character timing (reception mode).
6.2.1 ItO transmission timing for T.O protocol
The purpose of this lest is to determine the timing of the data transmitted by the card
(see ISO/1EC 7816-3:2006. 7.1. 7,2, 10.2).
6.2.1.1 ApparatusSee 4.7.1
6.2.1.2Procedure
Connect the card to the card-test-apparatus.
During the following procedure the contacts vCC,RST,CLK and lO shall be continuously monitored and allsignal transitions (level and timing) as well as the logical content of the communication shall be recorded:
a)Run the Test Scenario with the card with nominal bit-timing parameters (see lSO/IEC7816-3:2006,10.2).b)Repeat a) with every provided etu-factor.
c)Repeat a) and b) for all provided applications.6.2.1.3 Test report
Report the protocol recordings.
6.2.2 lo character repetition for T=0 protocol
The purpose of this test is to determine use and timing of the character repetition by the card(see ISOnEC 7816-3:2006,7.3).
6.2.2.1 Apparatus
See 4.7.1
6.2.2.2Procedure
Connect the card to the card-test-apparatus.
a)Run the Test Scenario with the card with nominal bit-timing parameters (see lSO/IEC 7816-3:2006,10.2).b)During the following part of the procedure the contacts VCC，RST,CLK and l/O shall be continuously
monitored and all signal transitions (level and timing) as well as the logical content of the communicationshall be recorded.
c)On each byte sent by the card generate five successive error conditions according to
ISO/EC 7816-3:2006,7.3 with minimum duration (1 etu + t.) and minimum time between the leadingedge of the start bit and the leading edge of the error signal ((10,5-0,2)etu + Ex).
d) on each byte sent by the card generate five successive error conditions according to
ISOIEC 7816-3:2006, 7.3 with maximum duration (2 etu – e) and maximum time between the leadingedge of the start bit and the leading edge of the error signal ((10,5+0,2) etu – Ex).
e)Repeat c) to d) for all provided ATRs (see class selection in ISOIEC 7816-3:2006,6.2.4).6.2.2.3Test report
Report the protocol recordings.