UL 1363:2007 pdf download – Relocatable Power Taps
UL 1363:2007 pdf download – Relocatable Power Taps.
28 Overcurrent Test
28.1 When required by note (b) of Table 11.1, 19.4 or 19,5, three previously untested RPTs are to be subjected to the Overcurrent Test as described in 28.2 — 28.6. The RPT shall comply with the requirements In 28.6 and 28.7. Each RPT shall be tested once.
28.2 All integral supplementary protection devices are to be shunted out of the circuit for this test.
28.3 The resistance of each circuit conductor path as specified in 19.4 arid 19.5 is to be determined by measuring the voltage drop when a current of 25 A. derived from a 60 Hz source with a no-load voltage riot exceeding 6 V, is passed between the input port and output port connectors of each conductor patti.
28.4 The RPT is to be mounted so as to provide free air flow around all sides and the top. The ambient temperature is to be 25 ±5°C (77 ±9°F). The load current and time duration Is to be as indicated In 28.5. Rated frequency is to be used. Any voltage not higher than the rated voltage is not prohábited from being used.
28.5 For a RPT with integral overcurrent protection, the overload current is to be 200 percent of the overcurrent device rating. For a RPT without integral overcurrent protection, the overload current is to be 200 percent of the current rating of the maximum size branch Circuit to which the RPT is intended to be connected. The overcurrent test current is to be applied for 2 min.
31.4 Low-temperature steel sphere Impact test
31.4.1 For a RPT with a polymeric enclosure, three samples of a APT shall be cooled to a temperature of 0.0 ±2.0°C (32.0 ±3.6°F) and maintained at this temperature for 24 h. While the unit is still cold, within 1 mm alter removal from the temperature chamber, the samples are to be subjected to the impact described in 31.3.1.
32 CrushIng Test
32.1 A RPT employing a metaihc or polymeric endosure is to be subiected to the crush test described in
32.4 wIthout any occurrence of the following:
a) Creation of any openings in the enclosure that result in accessibility of live parts, when evaluated in accordance with Accessibility of Live Paris, Section 7;
b) Any condition that is capable of affecting the intended mechanical performance of the APT; and
c) Any other condition that increases the risk of electric shock.
32.2 With reference to 32.1(b), the enclosure shall not crack or dent or affect the function of any features such as overcurrent protective devices or strain relief. Cracking or denting of the enclosure is not to result in exposure of moving parts capable of causing injury to persons.
32.3 With reference to 32.1(c). the RPT is to comply with the Dielectric Voltage-Withstand Test, Section
24. after being subiected to the crush tests described in this section.
32.4 A previously untested sample of a APT shall be placed on a 1)2-in (12.7-mm) thick, horizontal maple board, and a crushing force of 150 lbf (667.2 N) is to be applied to three different locations of Itie APT by means 01 a horizontal 3)4-In (19.1-mm) diameter steel rod. The rod is to be placed across the center of the smaller dimension of the test surface of the APT, perpendicular to the long axis of the APT. The length of the rod is to span the smaller dimension of the surface being tested. Force is to be gradually applied and maintained for a period of I mm. The crushing force Is not to be applied to protruding members of receptacles, switch toggles/triggers, indicator lamps and OCP reset members.
32.5 At the end of the tests described in 32.1 — 32.4, spacings shall not be less than those descnbed In Spacings, Section 18.