UL 61496-2:2002 pdf download – Electro-Sensitive Protective Equipment, Part 2: Particular Requirements for Equipment Using Active Opto-Electronic Protective Devices (AOPDs)
UL 61496-2:2002 pdf download – Electro-Sensitive Protective Equipment, Part 2: Particular Requirements for Equipment Using Active Opto-Electronic Protective Devices (AOPDs).
— where the SUPPLER states that The LiGHT os*u DEVICE can be used as a TRIP DEVICE, by moving the TR DEvICE lEST PIECE through the beam at 1.6 rn’s such that the direction of movement and the axis of the imp DEVICE i€sT PIECE are normal to The axis of the beam, at each end of the beam midway along the beam, and at any point throughout the operating distance which is considered critical as a result of Ihe analysis in 220.127.116.11.
The above tests shall be performed with the AOPO operating at the minimum specified operatIng distance
or 0,5 m, whichever is the greater, and at the maximum specified operating distance.
18.104.22.168 integrity of the AQPO detection capability
It shall be verttied that the AOPO DETECTION CAPABILJTV is maintained or the ESP€ does not fail to danqer, by systematic analysis of the design of the AOPO, using testing where appropriate, taking into account all combinations of the conditions specified in 4.1.2 and 4.2.12, and the FAIJ.TS specified in 5.3.
NOTE – In cases where It Is establIshed that the *c.c tec,,oa C earv I achieved by opttcal geometry based on the complete obscuration of al least one light beam anywhere within the imic. zo., further analysts and testing may not be necessary.
The results of the systematic analysis shall identify which tests in 5.4 require. in addition, a measurement of the RESPONSE ritE.
22.214.171.124 Aj4itionai tests fo an AOPD using retra-ref?ecrwe techniques
For a LIGHT BEAM DEVICE using retro-reflective techniques. the osso(s) shall go to the OFF-STATE when the retro-reflector is moved from its prescribed position by a distance smaller than or equal to 0,5 m along the optical axis in either direction, and shall remain in that state for further movement from its prescribed position.
It shall be verified that the SENSING oEv€ Is actuated when a retro-reflective plane object of a size equal to the diameter and length of the TEST PIECE 5 pLaced on and normal to the optical axis of the LIGHT BEAM DEVICE at a distance of 0,55 m from the retro•reflective sijrface
For a uo.r ctstr.ai using retro-reflective techniques. the osso(s) of a type 4 ESPE shall go to the OFF-STATE when an identical reflector is placed in contact with the sensing surface of the emittinglreceiving element(s).
It shall be verified that the s&r4saIG DEVICE is actuated when
1) a highfy reflective cylindrical object of a size equal to that of the TEST PIECE S p’aced anywhere within the DETEcTION ZONE of a LIGHT CURTAIN or in the beam of a LIGHT BEAM DEViCE, and
2) a highly reflective plane object of a size equal to the diameter and length of the TEST PIECE IS inserted, anywhere within the DETECTION ZONE of a LIGHT CUPTAt4 or in the beam of a uir BEAM DEVICE, normal to the optical axis.
For the AceD of a type 2 ESPE, the EAA of each beam shall not exceed 5 from the optical axis for distances in excess of 3 m between the emitting elements and the receiving elements, or between the emitter/receiver element and the reiro-reflector. For distances from 0,5 m up to and including 3,0 m, the EAA of each beam shall not exceed the value given in figure 6.
For the eo of a type 4 ESPE, the EAA of each beam shall not exceed 2.5 from me optical axis for distances in excess of 3 m between the emitting elements and the receiving elements, or between the ernitterreceiver element and the retro-reflector. For distances from 0,5 m up to and including 3,0 m, the s of each beam shall not exceed the value given in figure 6.
The switching of the A0PO from the ON-STATE to the 0FF-STATE and back to the ON-STATE as the optical axes of the emitter assembly and receiver assembly or of the emitter/receiver assembly and the retro-retlector, are rotated out of optical alignment, defines the limits of the E of those elements which shall be determined by the following tests (see figures 7 and 8).
With an emitter assembly or an emitlerreceiver assembly, fixed in optical alignment with a receiver assembly or a retro-reflector, the angle of misalignment of the receiver assembly or the retro-rellector shall be measured. With a receiver assembly or retro-reflector, fixed in optical alignment with an emitter assembly or an emitler,receiver assembly, the angle of misalignment of the emitting element or the emitter/receiver element shall be measured. These measurements shall be carned out in the following manner.
The rp shall be determined by rotating the assembly from the aligned position by an angle of 90g. The osso(s) shall go to the OFF-STATE. The assembly shall then be rotated back towards the aligned position until the position is reached at which the osso(s) goes to the ON-STATE. The angle between this position and the aligned position is the EM.