IEC 60034-18-32:2010 pdf – Rotating electrical machines – Part 18-32: Functional evaluation of insulation systems – Test procedures forform-wound windings – Evaluation by electrical endurance

IEC 60034-18-32:2010 pdf – Rotating electrical machines – Part 18-32: Functional evaluation of insulation systems – Test procedures forform-wound windings – Evaluation by electrical endurance. 7 DIagnostic sub-cycle 7.1 General Following each ageing sub-cycle, a diagnostic sub-cycle can be performed....
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IEC 60034-2-2:2010 pdf – Rotating electrical machines – Part 2-2: Specific methods for determining separate losses of large machinesfrom tests- Supplement to IEC60034-2-1

IEC 60034-2-2:2010 pdf – Rotating electrical machines – Part 2-2: Specific methods for determining separate losses of large machinesfrom tests- Supplement to IEC60034-2-1. NOTE I The test macbin. may b. dnvn by its normal pnm. mover, ..g by P.lton turbine...
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IEC 61158-6-21:2010 pdf – Industrial communication networks – Fieldbus specifications – Part 6-21: Application layer protocol specification -Type 21 elements

IEC 61158-6-21:2010 pdf – Industrial communication networks – Fieldbus specifications – Part 6-21: Application layer protocol specification -Type 21 elements. NOTE A device may conlain nor, than on. node 3.2.25 device profile a collection of device-dependent information and functionality providing...
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IEC 63093-2:2020 pdf – Ferrite cores – Guidelines on dimensions and the limits of surface irregularities – Part 2: Pot-cores for use in telecommunications, power supply, and filter applications

IEC 63093-2:2020 pdf – Ferrite cores – Guidelines on dimensions and the limits of surface irregularities – Part 2: Pot-cores for use in telecommunications, power supply, and filter applications. This part of IEC 63093 specifies the dimensions that are of...
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IEC 63185:2020 pdf – Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method

IEC 63185 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies.This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices.It uses...
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