UL 1977:2007 pdf download – Component Connectors for Use in Data, Signal, Control and Power Applications.
13 Accelerated Aging Test
13.1 Rubber compounds
13.1.1 A molded-rubber component shall show no apparent deterioration and shall show no greater change in hardness than ten numbers as the result of exposure for 70 hours in a full-draft circulating-air oven at a temperature of 100.0 ±2.0°C (212.0 ±1.8°F).
13.1.2 If possible, the complete device is to be tested. The hardness of the rubber is to be determined pror to testing as the average of five readings with an appropriate gauge such as die Rex Hardness Gauge or the Shore Durometer. The device is to be allowed to rest at room temperature for four or more hours after removal from the oven. The hardness is to be determined again as the average of five new readings. The difference between the average original hardness reading and the average reading taken after exposure to the heat conditioning is the change in hardness.
13.1.3 The accelerated-aging tests mentioned in 13.1.1 and 13.1.2 are to be made on each color of rubber and on each basic rubber compound employed for the device.
13.2 PVC compounds
13.2.1 A device having a body ol polyvinyl chloride or one of its copotymers shall show no cracks, discoloration, or other visible signs of deterioration as the result of exposure for 96 hours in a full-draft circulating•air oven at a temperature of 100.0 ±1.0°C (212.0 ±1.8°F).
Exception: A device having a body wrth a hardness of greater than Shore 065 as determined in accordance with ASTM 0 2240 need not be subjected to this test.
14 Mold Stress Relief Test
14.1 As a result of temperature conditioning as specified in 14.2, there shall not be any warpage, shrinkage or other distortion that results in any of the following:
a) Making uninsulated live parts, other than exposed wiring terminals or internal wiring, accessible to contact by the probe shown in Figure 10,1.
b) Defeating the integrity of the enclosure so that acceptable mechanical protection Is not afforded to internal parts of the device.
C) Interference with the operation, function, or installation of the device. The outlet openings of a female device shall be capable of having a mating male device of the intended configuration fully inserted.
d) A reduction of spacing below the minimum acceptable values of 11.1 between an
uninsulated live part and:
1) An uninsulated live part of opposite polarity,
2) An uninsulated grounded metal part, or
3) A non-current carrying metal part that is exposed to contact by persons when the device is installed and used in the intended manner.
15.9 A test usmg alternating current may be waived, if acceptable results have been obtained from an equivalent or higher volt-ampere test using a direct current voltage.
15.10 Alternating current is to be used If the device is rated for atternating current only. The power factor of the load is to be 0.75 to 0.80 for an ampere rated device,
16 Temperature Test
16.1 The temperature of a device, wtien measured at the points described in 16.3 shall not exceed the Relative Thermal Index (electrical or mechanical without impact) of the insulating matenal when the device is carrying its maximum rated current See 23.2(b)
Exception; A Type 0 or Type 14 device ,ot ass,gried a current rating is riot subjected to the temperature test.
Note: A Type 0 or IA device with an assigned current rating would be subjected to the temperature test.
16.2 The temperature test shall be performed following the overload test, if applicable, on the same test specimens.
16.3 The temperature measurement mentioned in 16.1 is to be made on the winng terminals of each device ii they are accessible for the mounting of thermocouples. If the wiring terminals are inaccessible, temperatures are to be measured as close as possible to the device current carrying contacts. The test is to continue for 4 hours even it stabilized temperatures are attained in a shorter period of time. A temperature is considered to be stabilized when three consecutive readings. taken at 5 minute intervals, indicate no further rise above the ambient temperature.
16.4 The test shall be conducted using the minimum rated wire size, and maximum number of terminations for the rated current stated in 16.1, Temperatures shall be measured on the wiring terminals of the pole location judged most likely to result in the highest temperatures.
Note: With all poles carrying rated current, the center pole or innermost pole will usually attain higher temperatures than the outer poles.